GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen

✍ Scribed by M. Pagels; F. Reinhardt; B. Pollakowski; M. Roczen; C. Becker; K. Lips; B. Rech; B. Kanngießer; B. Beckhoff

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 620 KB
• Volume: 268
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2009.09.009