✍ Scribed by Ulyanenkov, A. ;Chrost, J. ;Siffalovic, P. ;Chitu, L. ;Majkova, E. ;Erlacher, K. ;Guerault, H. ;Maier, G. ;Cornejo, M. ;Ziberi, B. ;Frost, F.
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The self‐assembled iron oxide nanoparticles synthesized by a high‐temperature solution phase reaction and the silicon dots produced by an ion bombardment have been investigated by using atomic force microscopy (AFM) and grazing‐incidence small‐angle scattering (GISAXS) technique. Both methods delivered the consistent results on the estimate for the particle size and shape and primary knowledge on the ordering of the objects. A distorted‐wave Born approximation approach has been used for X‐ray data fitting. In the case of the silicon dots, the dense long‐range particle distribution over the whole sample surface is found, where as FeO nanoparticles exhibit the short‐range correlations. Both results are consistent with the local AFM investigations.
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The crystal structures of seven crystals from five garnet mineral species have been studied through single-crystal X-ray diffraction methods incorporating scattering factor refinement procedures. The derived experimental scattering factors for each atomic species show similar scattering-angle-depend