✦ LIBER ✦
GeOI pMOSFETs Scaled Down to 30-nm Gate Length With Record Off-State Current
✍ Scribed by L. Hutin; C. Le Royer; J. Damlencourt; J. Hartmann; H. Grampeix; V. Mazzocchi; C. Tabone; B. Previtali; A. Pouydebasque; M. Vinet; O. Faynot
- Book ID
- 124049820
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 467 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0741-3106
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