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Genomic Distribution of Quantitative Trait Loci for Yield and Yield-related Traits in Common Wheat

✍ Scribed by Li-Yi Zhang; Dong-Cheng Liu; Xiao-Li Guo; Wen-Long Yang; Jia-Zhu Sun; Dao-Wen Wang; Aimin Zhang


Book ID
111331154
Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
334 KB
Volume
52
Category
Article
ISSN
1672-9072

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