Generation-recombination noise in the near fully depleted SIMOX SOI n-MOSFET - physical characteristics and modeling

✍ Scribed by Ang, D.S.; Lun, Z.; Ling, C.H.

• Book ID: 114617264
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 626 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.819371