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Generation-recombination noise in nongated and gated AlxGa1-xAs/GaAs TEGFETs in the range 1 Hz to 1 MHz
✍ Scribed by Yuping Chen; VanVliet, C.M.; Larkins, G.L., Jr.; Morkoc, H.
- Book ID
- 114538313
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 234 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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