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Generation of divacancies in silicon irradiated by 2-MeV electrons: depth and dose dependence: Bengt G Svensson and Magnus Willander, J appl Phys, 62, 1987, 2758–2762


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
152 KB
Volume
39
Category
Article
ISSN
0042-207X

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