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Generation lifetime monitoring on high resistivity silicon using gated diodes

✍ Scribed by G. Vanstraelen; K. De Backker; I. Debusschere; C. Claeys; G. Declerck


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
540 KB
Volume
288
Category
Article
ISSN
0168-9002

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