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Generating test patterns for VLSI circuits using a genetic algorithm

✍ Scribed by O'Dare, M.J.; Arslan, T.

Book ID: 124060104
Publisher: The Institution of Electrical Engineers
Year: 1994
Tongue: English
Weight: 192 KB
Volume: 30
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:19940524

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