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Generalized Likelihood Ratio Test for Voltage Dip Detection

✍ Scribed by Moschitta, A.; Carbone, P.; Muscas, C.

Book ID
114632100
Publisher
IEEE
Year
2011
Tongue
English
Weight
567 KB
Volume
60
Category
Article
ISSN
0018-9456

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## Abstract A design procedure for detecting additive changes in a state‐space model is proposed. Since the mean of the observations after the change is unknown, detection algorithms based on the generalized likelihood ratio test, GLR, and on window‐limited type GLR, are considered. As Lai (1995) p