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GATE simulations for optimization of pinhole imaging

✍ Scribed by Steven Staelens; Kathleen Vunckx; Jan De Beenhouwer; Freek Beekman; Yves D’Asseler; Johan Nuyts; Ignace Lemahieu


Book ID
103855985
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
346 KB
Volume
569
Category
Article
ISSN
0168-9002

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