✦ LIBER ✦
Gate length scaling trends of drive current enhancement in CMOSFETs with dual stress overlayers and embedded-SiGe
✍ Scribed by S. Flachowsky; A. Wei; T. Herrmann; R. Illgen; M. Horstmann; R. Richter; H. Salz; W. Klix; R. Stenzel
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 1003 KB
- Volume
- 154-155
- Category
- Article
- ISSN
- 0921-5107
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