Gate-Induced Carrier Delocalization in Quantum Dot Field Effect Transistors

✍ Scribed by Turk, Michael E.; Choi, Ji-Hyuk; Oh, Soong Ju; Fafarman, Aaron T.; Diroll, Benjamin T.; Murray, Christopher B.; Kagan, Cherie R.; Kikkawa, James M.

• Book ID: 126183053
• Publisher: American Chemical Society
• Year: 2014
• Tongue: English
• Weight: 949 KB
• Volume: 14
• Category: Article
• ISSN: 1530-6984
• DOI: 10.1021/nl5029655