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Gate field emitter failures: experiment and theory

โœ Scribed by Browning, J.; McGruer, N.E.; Meassick, S.; Chan, C.; Bintz, W.J.; Gilmore, M.


Book ID
117862080
Publisher
IEEE
Year
1992
Tongue
English
Weight
772 KB
Volume
20
Category
Article
ISSN
0093-3813

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