✦ LIBER ✦
Gate bias instability in polycrystalline silicon thin film transistors formed using various gate dielectrics
✍ Scribed by ND Young; A Gill
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 249 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0167-9317
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