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Gate Bias Effect on the 60-MeV Proton Irradiation Response of 65-nm CMOS nMOSFETs
✍ Scribed by Simoen, E.; Jurczak, M.; David, M.-L.; Claeys, C.; Mohammadzadeh, A.
- Book ID
- 114618352
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 231 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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