✦ LIBER ✦
Gate-Bias Controlled Charge Trapping as a Mechanism for NO2 Detection with Field-Effect Transistors
✍ Scribed by Anne-Marije Andringa; Juliaan R. Meijboom; Edsger C. P. Smits; Simon G. J. Mathijssen; Paul W. M. Blom; Dago M. de Leeuw
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 550 KB
- Volume
- 21
- Category
- Article
- ISSN
- 1616-301X
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