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G. Schmahl, D. Rudolph: X-ray microscopy. Proceedings of the international symposium Göttingen, Fed. Rep. of Germany, September 14.–16. 1983. Springer Series in Optical Sciences, Vol. 43. 343 p., 262 fig. Price: Cloth DM 68.—, Springer-Verlag Berlin, Heidelberg, New York-Tokyo 1984.ISBN 3-540-13271-6

✍ Scribed by O. Brümmer


Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
88 KB
Volume
20
Category
Article
ISSN
0232-1300

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