Further Comments on “Threshold voltage model for deep-submicrometer MOSFETs” and its extension to subthreshold operation

✍ Scribed by Niu, G.F.; Ruan, G.; Chen, R.M.M.

• Book ID: 114536661
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 147 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.544429