Further affects of manufacturing tolerances on the performance of linear shunt slot arrays

✍ Scribed by O'Neill, H.; Bailin, L.

• Book ID: 114666794
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1952
• Tongue: English
• Weight: 452 KB
• Volume: PGAP-4
• Category: Article
• ISSN: 2168-0639
• DOI: 10.1109/tpgap.1952.237344