Wire density in CAE analysis of high pin
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W.R. Jong; Y.R. Chen; T.H. Kuo
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Article
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2005
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Elsevier Science
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English
β 907 KB
Wire sweep has been recognized as one of the major defects in the encapsulation of microelectronic chips by the transfer molding process. As thinner and denser IC packages emerge, wire-sweep analysis becomes more challenging and troublesome. This paper studies the reactive flow in IC encapsulation