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Fundamental properties of ultrathin SOI MOSFETs fabricated by electron-beam anneal recrystallization

✍ Scribed by Makoto Yoshimi; Minoru Takahashi; Hiroaki Hazama; Shigeru Kambayashi; Kenji Natori


Book ID
112078406
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
720 KB
Volume
73
Category
Article
ISSN
8756-663X

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