𝔖 Bobbio Scriptorium

✦ LIBER ✦

Fundamental Principles of Engineering Nanometrology || Introduction to metrology for micro- and nanotechnology

✍ Scribed by Leach, Richard K.

Book ID: 118119691
Publisher: Elsevier
Year: 2010
Weight: 54 KB
Category: Article
ISBN: 0080964540
DOI: 10.1016/b978-0-08-096454-6.10001-6

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