Fundamental limitations in microelectronics. 1. MOS technology : B. Hoeneisen and C. A. Mead. Solid St. Electron.15 (1972), p. 819

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 110 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90059-5