✦ LIBER ✦
Fundamental considerations in creep-based determination of dislocation density in semiconductors grown from the melt
✍ Scribed by Shahryar Motakef
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 975 KB
- Volume
- 114
- Category
- Article
- ISSN
- 0022-0248
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