✦ LIBER ✦
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG
✍ Scribed by Andreas Veneris; Robert Chang; Magdy S. Abadir; Sep Seyedi
- Book ID
- 106384221
- Publisher
- Springer US
- Year
- 2005
- Tongue
- English
- Weight
- 861 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0923-8174
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