Functional degradation of NiZnCu-based multilayer chip inductors during nickel electroplating

✍ Scribed by Jiang Li Cao; Xiao Hui Wang; Li Zhang; Long Tu Li

• Book ID: 117357066
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 187 KB
• Volume: 57
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/s0167-577x(02)00797-8