✦ LIBER ✦
Fully automatic VLSI diagnosis in a CAD-linked E-beam probing system
✍ Scribed by M. Melgara; M. Battu'; P. Garino; J. Dowe; M. Marzouki
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 698 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0167-9317
No coin nor oath required. For personal study only.
✦ Synopsis
The use of E-beam equipment in VLSI validation has been stated repeatedly in the past. However, only recently, the necessity for a full integration between the CAD (Computer Aided Design) world and the E-Beam world has been felt. The next step is to completely automate the E-beam debugging procedure. This paper, after a draft description of an integrated E-beam debugging system, developed under Esprit Project 27i °, will present the strategies and the algorithms to achieve a fully automatic trouble-shooting procedure.