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Fullerene ion (C60+) damage in Si at 25°C

✍ Scribed by Hao Shen; C. Brink; P. Hvelplund; S. Shiryaev; PeiXiong Shi; J.A. Davies


Book ID
114169297
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
390 KB
Volume
129
Category
Article
ISSN
0168-583X

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