Full-wave modelling of offset overlap and gap discontinuity for asymmetric strip conductors in multi-layered MIC environment
✍ Scribed by Rajiv Kumar Shukla; Animesh Biswas
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 162 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
A generalised model for characterising the frequency dependent properties of general offset overlap and gap discontinuity of asymmetric strip conductors in multi‐layered MIC environment is presented in this paper. The transverse resonance technique is applied in transformed domain to extract the equivalent PI‐circuit parameters of the discontinuity. The incorporation of options for offset between the strips and asymmetry in strip widths make the present model very general and useful for different structures in multi‐layered substrate environment. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 247–251, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10570