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Full-wave electromagnetic and thermal modeling for the prediction of heat-dissipation-induced RF-MEMS switch failure

✍ Scribed by Wang, Zhongde; Jensen, Brian D; Chow, Linda L W; Volakis, John L; Saitou, Kazuhiro; Kurabayashi, Katsuo


Book ID
120335364
Publisher
Institute of Physics
Year
2005
Tongue
English
Weight
589 KB
Volume
16
Category
Article
ISSN
0960-1317

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