Full Two-Dimensional Markov Chain Analysis of Thermal Soft Errors in Subthreshold Nanoscale CMOS Devices

✍ Scribed by Jannaty, P.; Sabou, F.C.; Bahar, R.I.; Mundy, J.; Patterson, W.R.; Zaslavsky, A.

• Book ID: 115512398
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 745 KB
• Volume: 11
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/tdmr.2010.2069100