Full Three-Dimensional Quantum Transport Simulation of Atomistic Interface Roughness in Silicon Nanowire FETs

✍ Scribed by SungGeun Kim; Luisier, M.; Paul, A.; Boykin, T.B.; Klimeck, G.

• Book ID: 114620425
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 1002 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2118213