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Full Three-Dimensional Quantum Transport Simulation of Atomistic Interface Roughness in Silicon Nanowire FETs

โœ Scribed by SungGeun Kim; Luisier, M.; Paul, A.; Boykin, T.B.; Klimeck, G.


Book ID
114620425
Publisher
IEEE
Year
2011
Tongue
English
Weight
1002 KB
Volume
58
Category
Article
ISSN
0018-9383

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