Full-pattern parametrization of two-dime
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N.S. Murthy; K. Zero
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Article
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1997
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Elsevier Science
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English
โ 355 KB
Two-dimensional wide-angle X-ray scattering data from oriented polymers are profile fitted by describing the intensity distribution as a product of two orthogonal functions in polar cylindrical coordinates. The parameters of the fit are used to describe the structure in terms of amorphous and crysta