✦ LIBER ✦
Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method
✍ Scribed by Xide Li; Cheng Wei; Yan Yang
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 713 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0143-8166
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