Full Color Emission from II–VI Semiconductor Quantum Dot–Polymer Composites

✍ Scribed by J. Lee; V. C. Sundar; J. R. Heine; M. G. Bawendi; K. F. Jensen

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 252 KB
• Volume: 12
• Category: Article
• ISSN: 0935-9648
• DOI: 10.1002/1521-4095(200008)12:15<1102::aid-adma1102>3.0.co;2-j

✦ Synopsis

IIIa). Images were produced in the height mode using silicon cantilevers (Nanosensors, 120 mm, tip radius 5±10 nm) at a scan speed of 1 Hz. A 10 mm ´10 mm scanner was used for imaging. The monolayers deposited on Au(111) were analyzed by scanning tunneling microscopy and spectroscopy (Pico SPM, Molecular Imaging). Images were obtained in the constant current mode under ambient conditions at a scan rate of 10±20 Hz per image [sample bias = +200 mV, mechanically cut Pt/Ir (Ir = 10 %) tip]. I±V plots were obtained fixing the tip at the center of the image and at constant conditions (bias voltage = 200 mV, current = 80 nA). A linear voltage profile between ±0.8 V and +0.8 V was applied and the current response was recorded. The cycle was repeated 64 times within a time slot of 36 ms and the individual responses were used to compute an averaged I±V curve.