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Full band Monte Carlo simulation of zincblende GaN MESFET's including realistic impact ionization rates

✍ Scribed by Farahmand, M.; Brennan, K.F.

Book ID: 114537765
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 125 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.772471

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