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FTIR Measurements of Thickness and Free Carrier Concentration in GaN-Based Films

✍ Scribed by C. Bozdog; V. Yakovlev; S. Bosch-Charpenay; P. Rosenthal

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Correlation of Surface Potential, Free C

✍ U. Haboeck; A. Kaschner; A. Hoffmann; C. Thomsen; T. Riemann; A. Krtschil; J. Ch 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 742 KB