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FTIR Ellipsometry as a Tool for Studying Organic Layers: From Langmuir-Blodgett Films to Can Coatings

✍ Scribed by Tsankov, D. ;Hinrichs, K. ;R�seler, A. ;Korte, E.H.


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
161 KB
Volume
188
Category
Article
ISSN
0031-8965

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