FT-Raman Studies of Charged Defects Created on Methyl End-Capped Oligothiophenes by Doping with NOBF4

✍ Scribed by Juan Casado; Víctor Hernández; Shu Hotta; Juan T. López Navarrete

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 155 KB
• Volume: 10
• Category: Article
• ISSN: 0935-9648
• DOI: 10.1002/(sici)1521-4095(199812)10:17<1458::aid-adma1458>3.0.co;2-w