Frustrated Total Internal Reflection: Resonant and Negative Goos–Hänchen Shifts in Microwave Regime

✍ Scribed by Min Qu; Zhi-Xun Huang

• Book ID: 108232188
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 984 KB
• Volume: 284
• Category: Article
• ISSN: 0030-4018
• DOI: 10.1016/j.optcom.2011.01.038