✦ LIBER ✦
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
✍ Scribed by D. Lewis; V. Pouget; T. Beauchêne; H. Lapuyade; P. Fouillat; A. Touboul; F. Beaudoin; P. Perdu
- Book ID
- 108361872
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 551 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.