✦ LIBER ✦
From wafer-level gate-oxide reliability towards ESD failures in advanced CMOS technologies
✍ Scribed by Kerber, A.; Rohner, M.; Wallace, C.; O'Riain, L.; Kerber, M.
- Book ID
- 114618173
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 511 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.