From the editor

✍ Scribed by Rene Van Grieken

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 50 KB
• Volume: 27
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199809/10)27:5<291::aid-xrs320>3.0.co;2-u

✦ Synopsis

From the Editor

Following up from my last editorial (XRS 27 :3) where I mentioned our aim to increase the breadth and scope of XRS I am pleased to be able to announce a number of new developments that have occurred over the last few weeks. Our plan to publish a special article per issue is progressing well. Two authors have agreed to write Tutorial articles on the following topics "New Detectors in XRSÏ (M. Kurakado, Nippon Steel Corporation, Japan) and "Chemical State AnalysisÏ (D. Urch, Queen Mary College, UK). These tutorial articles will cover an emerging Ðeld of x-ray spectroscopy and will be written by experts for the beneÐt of non-specialists. We also have two Account articles planned from T. Elam (Naval Research Laboratory, USA) and C. Streli (X-Ray Laboratory of the Atom Institute, Austria). These accounts will be review-type articles covering the research history and sig-niÐcant ideas and results (also the ups and downs) from a particular research group. A review article on "Reference Standards in XRSÏ (V. Kocman, Domtar Innovation Center, Canada) will also be published.

We also have a number of exciting Special Issues planned for the near future. These are as follows :