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From nanometre to millimetre: a feasibility study of the combination of scanning probe microscopy and combined optical and x-ray interferometry

✍ Scribed by Yacoot, Andrew; Koenders, Ludger


Book ID
111916122
Publisher
Institute of Physics
Year
2003
Tongue
English
Weight
257 KB
Volume
14
Category
Article
ISSN
0957-0233

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