Friedel-pair based indexing method for characterization of single grains with hard X-rays

✍ Scribed by M. Moscicki; P. Kenesei; J. Wright; H. Pinto; T. Lippmann; A. Borbély; A.R. Pyzalla

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 486 KB
• Volume: 524
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2009.05.002