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Friction measurements of CNx and TiCxNy films by scanning force microscopy

✍ Scribed by C. Morant; L. A. Fernández; C. Quirós; G. G. Fuentes; E. Elizalde; J. M. Sanz

Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
93 KB
Volume
30
Category
Article
ISSN
0142-2421

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