Fretting corrosion of solder-coated electrical contacts: Morton Antler IEEE Trans Components Hybrids Nfg Technol. Chmt-7, 129 (March 1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 180 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2692
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โฆ Synopsis
Early in AT & T Bell Laboratories involvement with plasma smear removal for multilayer boards, the generic problem of uniform etching over large size panels became obvious'.'Tr were developed which provide a quantit.~tive measurement of the etch uniformity. These techniques were used to evaluate the etch performance of existing reactors and as an aid in devloping a better understanding of the factors which influence etch uniformity. The characterization procedure enabled the development of new reactor geometries which greatly improve etch uniformity as compared to previously used configurations. This paper describes the steps along the road to uniform etching of printed circuit boards.
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