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Fretting corrosion of solder-coated electrical contacts: Morton Antler IEEE Trans Components Hybrids Nfg Technol. Chmt-7, 129 (March 1984)


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
180 KB
Volume
16
Category
Article
ISSN
0026-2692

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โœฆ Synopsis


Early in AT & T Bell Laboratories involvement with plasma smear removal for multilayer boards, the generic problem of uniform etching over large size panels became obvious'.'Tr were developed which provide a quantit.~tive measurement of the etch uniformity. These techniques were used to evaluate the etch performance of existing reactors and as an aid in devloping a better understanding of the factors which influence etch uniformity. The characterization procedure enabled the development of new reactor geometries which greatly improve etch uniformity as compared to previously used configurations. This paper describes the steps along the road to uniform etching of printed circuit boards.


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