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Frequency of intron loss correlates with processed pseudogene abundance: a novel strategy to test the reverse transcriptase model of intron loss

✍ Scribed by Tao Zhu, Deng-Ke Niu


Book ID
120683854
Publisher
BioMed Central
Year
2013
Tongue
English
Weight
255 KB
Volume
11
Category
Article
ISSN
1741-7007

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