Frequency-domain reflectometry for on-board testing of aging aircraft wiring

✍ Scribed by Furse, C.; You Chung Chung; Dangol, R.; Nielsen, M.; Mabey, G.; Woodward, R.

• Book ID: 114624160
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 447 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9375
• DOI: 10.1109/temc.2003.811305